2000 – Victoria, BC, Canada

  • October 15-18, 2000 – Victoria, BC, Canada (The Empress Hotel)

Program:

Report on CEIDP 2000:

  • Report on CEIDP 2000: Not available

Proceedings:

Whitehead Lecturer:

  • 2000 Whitehead Memorial Lecturer: Prof. Christian Mayoux, CNRS-Université Paul Sabatier, France.

Title— On the degradation of insulating materials withstanding electrical stress

Abstract— An avalanche of physical and physico-chemical phenomena, often self-sustained, lead to the end of life of an insulating material. The collapse of the insulating role of a material is greatly due to the electrical field stress. The path leading from the catastrophic situation, the breakdown, to its origin is followed in the present report. A defect, preexisting or created by the in service stresses, gives rise to an ionization process in a volume bounded by insulating walls. With time the process does not remain identical according to the evolution both of the material and of the gas making sometimes difficult the selection of the electrical signal detected. The end of life will occur through micro-cracks in which new discharges are initiated activating the propagation of these structural failures. This change of structure of the insulating material when due to the existence of water molecules will lead to the same kind of final degradation. The polymeric insulating materials could contain antidotes but they lead only to a partial healing. From polymers as little complex as the polyethylene used in cables, assuming that there is no preexisting defect one endeavours to understand how a microstructure reacts with a local field or accumulated charges. The present material summarizes the thoughts of the author pertaining to the problems of ageing and dielectric breakdown in organic insulating materials, processes often given a concrete form through experiments.

Prof. Christian Mayoux short Bio: Christian Mayoux received the Doctorate degree in 1961 from the University of Toulouse from which Paul Sabatier University was established in 1969. From 1963 to 1966, he was lecturer at the University before joining the French National Center for Scientific Research (CNRS) and the new born“Laboratoire de Génie Électrique de Toulouse” (LGET). Christian Mayoux received many invitations for giving invited lectures either at international conferences or during seminars. He was awarded the Whitehead Memorial Lecture at the Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) in 2000. Apart from his scientific carrier per se, Christian Mayoux was instrumental in developing international collaborations, especially through his activities within IEEE-DEIS Conferences. He was a member of scientific committees for major IEEE international conferences on Dielectrics and Electrical Insulation and, notably, was a member of the steering committee of the first ICPADM held in Xi’an, China, in 1985, at the onset of “New China”. One of the major contributions of Christian Mayoux to our community was his involvement in the launch of the IEEE conference series “International Conference on Conduction and Breakdown in Solid Dielectrics” (ICSD)–now “International Conference on Dielectrics” (ICD). The initiative went from IEEE through the voice of Eric Forster. These two understood each other in a perfect way and the first ICSD was held in Toulouse in 1983. ICSD came back in Toulouse in 2004 and is still well alive.

  • 2000 CEIDP Whitehead Lecturer Article on IEEE Xplore: Click Here